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https://www.illumina.com/systems/sequencing-platforms/miseqdx.html

MiSeqDx System is FDA-regulated, CE-IVD-marked, NGS platform for in vitro diagnostic (IVD) testing. System offers both diagnostic and research modes.

Proper citation: Illumina: MiSeqDx System (RRID:SCR_016380) Copy   

•   Source: SciCrunch Registry

https://www.illumina.com/systems/sequencing-platforms/hiseq-x.html

THIS RESOURCE IS NO LONGER IN SERVICE. Documented on November 15,2023. Sequencer for whole-genome sequencing. System consists of HiSeq X ultra-high-throughput instruments that deliver over 18,000 human genomes per year.

Proper citation: Illumina: HiSeq X (RRID:SCR_016385) Copy   

•   Source: SciCrunch Registry

https://support.illumina.com/sequencing/sequencing_instruments/hiseq_2500.html

High-throughput sequencing system. High-quality data using proven Illumina SBS chemistry has made it the instrument of choice for major genome centers and research institutions throughout the world.HiSeq 2500 System has been discontinued. Illumina will support the instrument and intends to supply the reagents through February 28, 2023.

Proper citation: Illumina: HiSeq 2500 System (RRID:SCR_016383) Copy   

•   Source: SciCrunch Registry

https://www.agilent.com/en/product/automated-electrophoresis/femto-pulse-systems/femto-pulse-system/femto-pulse-system-365750

Femto Pulse System separates large molecular weight DNA fragments and detects nucleic acids into femtogram range.Fragment analyzer that provides pulsed field power supply which allows large molecular weight DNA fragments to be separated and nucleic acids detected into femtogram range. Ability to separate high molecular weight DNA up to 165 kb and detect nucleic acids down to 50 fg per uL input concentration makes system ideal for long-read NGS QC, gDNA, small RNA, or cfDNA analysis from low concentration samples.

Proper citation: Agilent: Femto Pulse System (RRID:SCR_018058) Copy   

•   Source: SciCrunch Registry

https://www.rigaku.com/products/wdxrf/primus400

Sequential WDXRF spectrometer for large samples with elemental analysis of solids, liquids, powders, alloys and thin films.

Proper citation: Rigaku: ZSX Primus 400 spectrometer (RRID:SCR_020496) Copy   

•   Source: SciCrunch Registry

https://www.rigaku.com/products/protein/xtalcheck

Automated in situ x ray crystallography that screens protein crystals on single crystal X ray diffractometer.

Proper citation: Rigaku: XtalCheck diffractometer (RRID:SCR_020493) Copy   

•   Source: SciCrunch Registry

https://www.rigaku.com/products/smc/xtalabmini

Benchtop single crystal x ray diffractometer.

Proper citation: Rigaku: XtaLAB Mini II diffractometer (RRID:SCR_020491) Copy   

•   Source: SciCrunch Registry

https://www.rigaku.com/products/detectors/micron-fc

Compact 2D X ray camera for topography and imaging applications X ray and EUV detector.

Proper citation: Rigaku: Xsight Micron FC (RRID:SCR_020492) Copy   

•   Source: SciCrunch Registry

https://www.fishersci.ca/shop/products/sorvall-rc-6-plus-centrifuge/361010816

Thermo Scientific Sorvall RC 6 Plus Centrifuge has been discontinued. Please consider our recommended replacement: Thermo Scientific Sorvall LYNX Superspeed Centrifuge Series.

Proper citation: Sorvall: RC-6 Centrifuge (RRID:SCR_020523) Copy   

•   Source: SciCrunch Registry

http://microtomeserviceco.com/index.php?route=product/product&product_id=51

SORVALL MT-6000 improves the accuracy and reproducibility of the time-tested SORVALL mechanical advance system. Other improvements include a new fiber optics approach lighting system, a diffuse lighting and viewing system, a highly effective built-in vibration dampening system, precise digital speed and thickness controls, and the Visutrac system. All combine to make the MT-6000 an excellent microtome for electron or light microscopy.

Proper citation: Sorvall: MT-RMC 6000 Ultra Microtome (RRID:SCR_020524) Copy   

•   Source: SciCrunch Registry

https://www.rigaku.com/node/255

Dual wavelength Confocal Max Flux CMF optics for single crystal X ray diffraction. Focuses and monochromatizes two different X ray wavelengths for single crystal X ray diffraction applications.

Proper citation: Rigaku: VariMax DW (RRID:SCR_020488) Copy   

•   Source: SciCrunch Registry

https://www.rigaku.com/products/semi/wda3650

Simultaneous WDXRF spectrometer film thickness and composition measurements on wafers and media disks.

Proper citation: Rigaku: WDA-3650 spectrometer (RRID:SCR_020489) Copy   

•   Source: SciCrunch Registry

https://www.sonybiotechnology.com/wordpress/wp-content/uploads/2016/05/Synergy_Datasheet9-small.pdf

SY3200 cell sorter platform is expandable to a dual system layout, effectively enabling two systems in one.

Proper citation: Sony biotechnology: SY3200 Cell Sorter (RRID:SCR_020522) Copy   

•   Source: SciCrunch Registry

https://www.rigaku.com/products/thermal/8311

Thermomechanical analyzer. Measurement of a mechanical property change with respect to temperature.

Proper citation: Rigaku: TMA8311 Thermal Analyzer (RRID:SCR_020486) Copy   

•   Source: SciCrunch Registry

https://www.rigaku.com/products/semi/waferx310

In line, simultaneous WDXRF spectrometer film thickness and composition measurements on blanket wafers.

Proper citation: Rigaku: WaferX 310 spectrometer (RRID:SCR_020487) Copy   

•   Source: SciCrunch Registry

https://www.labx.com/product/sorvall-legend-rt

Legend RT is a general-purpose tabletop centrifuge for biotechnological and pharmaceutic research. .The user-friendly "QUIKset" control panel permits easy selection of speed, RCF value, run time and deceleration profile, as well as temperature of the Legend RT. You can switch from speed to RCF display and vice versa, with a touch of a button and even during a run

Proper citation: Sorvall: Legend RT Centrifuge (RRID:SCR_020520) Copy   

•   Source: SciCrunch Registry

https://www.struers.com/en/Products/Electrolytic-Preparation/Electrolytic-equipment/LectroPol

LectroPol-5 is designed for automated electrolytic polishing and etching of metallographic specimens. A scanning function for easy determination of parameters, built-in safety features, and a database with methods for various materials enables short polishing times and maximum reproducibility. LectroPol-5 consists of two units, the control unit and the polishing unit. The two units can be separated from each other. LectroPol-5 features a scanning function that helps to determine the correct voltage for both polishing and etching, thus saving time and avoiding human error. LectroPol-5 displays the scan curve, while the user selects and sets the voltage. The LectroPol-5 comes with ten polishing/etching methods for various materials, enabling immediate preparation of a wide range of materials without any lengthy and time-consuming trials.

Proper citation: Struers: Lectro Pol 5 electropolisher (RRID:SCR_020529) Copy   

•   Source: SciCrunch Registry

https://www.labx.com/item/kla-tencor-p-10-surface-profiler/LV40252132

Computer controlled manual wafer load profilometer with Max wafer size of 8"/200mm that measures roughness, waviness, step height, and other surface characteristics. Capabilities of this instrument include: Measurement of vertical features ranging from under 100Ã… (0.4 min.) to approximately 300 �m (11 mils), with a vertical resolution of 0.5, 2, or 10Ã…, A virtually unlimited number of data points per profile guarantee that the horizontal resolution is limited by the stylus radius and not by the number of data points, Measurement of many roughness and waviness parameters, with user-selectable cutoff filters to isolate roughness and waviness, Ability to fit and level a scan, allowing accurate step height measurements on curved surfaces, and the Ability to detect the edge or apex of a profile feature, allowing automated data analysis relative to the feature. The KLA P-10 to repeat a scan up to ten times and automatically calculate the average, thereby minimizing the effects of environmental noise on measurements. KLA-Tencor P10 can profile a variety of materials including: Semiconductor wafers, Thin-film heads, Precision-machined and polished surfaces, Ceramics for micro-electronics, Glass for flat panel displays, and Optical surfaces

Proper citation: Tencore: KLA P-10 Surface Profiler (RRID:SCR_020535) Copy   

•   Source: SciCrunch Registry

https://www.rigaku.com/products/wdxrf/primus

Sequential WDXRF spectrometer with elemental analysis of solids, liquids, powders, alloys and thin films, from beryllium Be through uranium U

Proper citation: Rigaku: ZSX Primus spectrometer (RRID:SCR_020497) Copy   

•   Source: SciCrunch Registry

https://www.siemens-healthineers.com/en-us/magnetic-resonance-imaging/3t-mri-scanner/magnetom-skyra

Siemens 3T MAGNETOM Skyra scanner with new software that enables rapid imaging.

Proper citation: Siemens: 3T Magnetom Skyra MRI scanner (RRID:SCR_020530) Copy   

•   Source: SciCrunch Registry