Tools   Select Another Resource Report Type

https://www.jeolusa.com/PRODUCTS/Transmission-Electron-Microscopes-TEM/200-kV/JEM-2100Plus

Multipurpose transmissoin electron microscope ombining optic system of original JEM 2100 with advanced control system for enhanced ease of operation.

Proper citation: JEOL: JEM-2100Plus Transmission Electron Microscope (RRID:SCR_020173) Copy   

•   Source: SciCrunch Registry

https://www.jeolusa.com/PRODUCTS/Photomask-Direct-Write-Lithography/Electron-Beam-Lithography/JBX-8100FS

Electron beam lithography system that writes ultrafine patterns at faster rate of speed while minimizing idle time, especially during exposure process, thus increasing throughput.

Proper citation: JEOL: JBX-8100FS Electron Beam Lithography System (RRID:SCR_020170) Copy   

•   Source: SciCrunch Registry

https://www.kratos.com/products/axis-nova

AXIS Nova combines XPS imaging and spectroscopic capabilities with a highly automated, large sample handling system and is the next generation of AXIS Nova spectrometer. The AXIS Nova is based on Kratos, AXIS technology comprising: magnetic and electrostatic transfer lenses; co-axial electron-only charge neutralisation; spherical mirror and hemispherical electron energy analysers. Kratos developed innovations such as the delay-line detector for spectroscopy and imaging modes and high energy X-ray excitation sources ensure the AXIS Nova is capable of performing in the most demanding research and development environments.

Proper citation: Kratos: AXIS-165 XPS Surface Analylsis System (RRID:SCR_020207) Copy   

•   Source: SciCrunch Registry

https://www.jeolusa.com/PRODUCTS/Microprobe-EPMA-and-Auger/JAMP-9500F

Electrostatic hemispherical analyzer with multi channel detector optimally designed for Auger analysis that provides user selectable energy resolution for high throughput high resolution and high sensitivity.

Proper citation: JEOL: JAMP-9510F Elecrostatic hemispherical analyzer (HSA) (RRID:SCR_020168) Copy   

•   Source: SciCrunch Registry

https://www.jeolusa.com/PRODUCTS/Mass-Spectrometers/SpiralTOF-MALDI-TOF-TOF

Mass spectrometer with long flight path that results in ultrahigh resolving power greater than 75,000 and sub ppm mass accuracy.

Proper citation: JEOL: SpiralTOF-plus MALDI TOF/TOF Mass Spectrometer (RRID:SCR_020201) Copy   

•   Source: SciCrunch Registry

https://www.jeolusa.com/PRODUCTS/Nuclear-Magnetic-Resonance/Probes/ROYAL-Probe

Probe that combines performance of broadband probe for heteronuclear measurements and inverse probe for 1H and 19F measurements.

Proper citation: JEOL: ROYAL Nuclear Magnetic Resonance (NMR) Probe (RRID:SCR_020208) Copy   

•   Source: SciCrunch Registry

https://www.leica-microsystems.com/products/stereo-microscopes-macroscopes/p/leica-s8-apo/

Greenough stereo microscope, Leica S8 APO with apochromatic 8:1 zoom and 75mm working distance allows easy access to specimen even at high magnification up to 80x which is best for quality control, cell sorting and microinjection applications. Ergonomic 38 viewing angle provides comfort, which helps increase productivity, reduce fatigue related inspection errors and acquire precise positioning while working with incident or transmitted light. Adjustable zoom stops allows fast, easy, repeatable measurements and inspections. The Integrated Documentation port allows to connect digital cameras.

Proper citation: Leica: APO S8 Microscope (RRID:SCR_020209) Copy   

•   Source: SciCrunch Registry

https://www.jeolusa.com/PRODUCTS/Focused-Ion-Beam/JIB-4700F

Focused ion beam that can be used in morphological observations, elemental and crystallographic analyses of variety of specimens.

Proper citation: JEOL: JIB-4700F Focused Ion Beam (RRID:SCR_020188) Copy   

•   Source: SciCrunch Registry

https://www.jeolusa.com/PRODUCTS/Scanning-Electron-Microscopes-SEM/HV-LV-Tungsten-LaB6-SEMs/JSM-IT200-InTouchScope

Scanning electron microscope that is compact and versatile and delivers high resolution imaging with unsurpassed low kV performance and high sensitivity solid state BSE detector included with LV models.

Proper citation: JEOL: JSM-IT200 InTouchScope Scanning Electron Microscope (SEM) (RRID:SCR_020186) Copy   

•   Source: SciCrunch Registry

https://www.jeolusa.com/PRODUCTS/Nuclear-Magnetic-Resonance/JNM-ECZR

Nuclear magnetic resonance spectormeter that enables highly sophisticated measurements to be carried out while most routine measurement operations can be performed automatically.

Proper citation: JEOL: JNM-ECZR Nuclear Magnetic Resonance (NMR) Spectrometer (RRID:SCR_020183) Copy   

•   Source: SciCrunch Registry

https://www.jeolusa.com/PRODUCTS/Mass-Spectrometers/GC-Single-Quadrupole-Mass-Spectrometer

Mass spectrometer that can be used for wide range of applications such as environmental analysis for agrichemicals and mold odor, material analysis, and aroma analysis.

Proper citation: JEOL: JMS-Q1500GC Single-Quad Mass Spectrometer (RRID:SCR_020182) Copy   

•   Source: SciCrunch Registry

https://downloads.leica-microsystems.com/Leica%20DFC425/Brochures/Leica_DFC425_DFC425C_Brochure_EN.pdf

Leica DFC495 is a digital camera with 8 Megapixel CCD that quickly captures high-resolution images microscopy in life science.. The scan preview in SXGA resolution provides up to 18 frames per second (fps) and allows the sample to be adjusted and focussed directly on the computer screen. The Peltier cooling reduces noise for imaging in low light conditions.

Proper citation: Leica: DFC 452 Microscope Camera (RRID:SCR_020215) Copy   

•   Source: SciCrunch Registry

https://www.jeol.co.jp/en/products/detail/JIB-4000PLUS.html

Focused ion bean that is milling and imaging system featuring high performance ion optical column

Proper citation: JEOL: JIB-4000PLUS Focused Ion Beam (RRID:SCR_020178) Copy   

•   Source: SciCrunch Registry

https://www.leicabiosystems.com/histology-equipment/he-slide-stainers-special-stainers-coverslippers/leica-st5010/

Autostainer XL continues to provide reproducible, consistent, high-quality staining and increased workload throughput. Plus, combine it with the CV5030 Glass Coverslipper to create a workstation that eliminates the manual handling of slide racks between staining and coverslipping. Can be used stand-alone or integrated with the Leica CV5030 Glass Coverslipper to create a ‘walk-away, staining/coverslipping workstation. Upgrade at anytime to match your laboratory's specific needs.

Proper citation: Leica: Autostainer XL Automated Slide Stainer (RRID:SCR_020212) Copy   

•   Source: SciCrunch Registry

https://www.jeolusa.com/PRODUCTS/Mass-Spectrometers/AccuTOF-LC-Plus

Mass spectrometer with analyzer design that employs elegant ion optics and ADC based digitizer to deliver dynamic range exceeding 4 orders of magnitude, without compromising resolution or mass accuracy.

Proper citation: JEOL: AccuTOF LC-plus 4G Time-of-Flight Mass Spectrometer (RRID:SCR_020154) Copy   

•   Source: SciCrunch Registry

https://www.jeol.co.jp/en/products/detail/JEM-2100F.html

JEM-2100F is a multipurpose, 200 kV FE (Field Emission) analytical electron microscope. Variety of versions is provided to adapt user's purposes. The FE electron gun (FEG) produces highly stable and bright electron probe that is never achieved with conventional thermionic electron gun. This feature is essential for ultrahigh resolution in scanning transmission microscopy and in an analysis of a nano-scaled sample. Various analytical instruments and/or cameras such as EDS (Energy Dispersive X-ray Spectrometer) or EELS (electron energy loss spectrometer) or CCD cameras are ready for integration with a PC system of the microscope control.

Proper citation: JEOL: 2100F Transmission Electron Microscope (RRID:SCR_020155) Copy   

•   Source: SciCrunch Registry

https://www.jeolusa.com/PRODUCTS/Mass-Spectrometers/AccuTOF-GCxGC-MS

Mass spectrometer that offers both chromatographic separation and high resolution mass spectra. Offers variety of ion sources and features Instrument Detection Limit of 16 fg, statistically calculated from repeated injections of 100 fg octafluoronaphthalene.

Proper citation: JEOL: AccuTOF GCxGC Mass Spectrometer (RRID:SCR_020151) Copy   

•   Source: SciCrunch Registry

https://www.biocompare.com/Product-Reviews/40566-Countess-Automated-Cell-Counter-from-Invitrogen/

Countess Automated Cell Counter from Invitrogen is a benchtop automated cell counter. It can perform cell counts as well as viability and cell calculations. The Countess has a touch screen display and allows data to be transferred via USB drive to a computer for data access and storage.

Proper citation: Thermo Fisher: Invitrogen: Countess Countess (RRID:SCR_020149) Copy   

•   Source: SciCrunch Registry

https://www.brown.edu/research/facilities/proteomics/about/office-hours

Circular dichroism (CD) spectroscopy measures differences in the absorption of left-handed polarized light versus right-handed polarized light that arise due to structural asymmetry. The absence of regular structure results in zero CD intensity, while an ordered structure results in a spectrum which can contain both positive and negative signals.

Proper citation: Jasco: J-815 Spectropolarimeter (RRID:SCR_020145) Copy   

•   Source: SciCrunch Registry

http://hunter-cuny.eagle-i.net/i/00000136-8892-389c-949b-425080000000

THIS RESOURCE IS NO LONGER IN SERVICE. Documented on November 5,2023.JEOL JEM-100CX II transmission electron microscope is an electron microscope with imaging capabilities at low to high magnifications (90X to 800, 000X). A 10M-pixel HAMAMASTU C4742-95 digital camera is integrated to the system for high- image acquisition.

Proper citation: JEOL: JEM-100CX II Transmission Electron Microscope (RRID:SCR_020146) Copy   

•   Source: SciCrunch Registry