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https://www.fei.com/products/fib/optifib-taipan-for-semiconductors/
Focused ion beam system that for semiconductors that enables a highly controlled beam profile and current, accurate navigation and ion beam placement, and reliable end-pointing.
Proper citation: FEI: OptiFIB Taipan for Semiconductors (RRID:SCR_019895) Copy
https://www.fei.com/products/sem/phenom-gsr/
Desktop scanning electron microscope that is used to scan sample and find suspect gunshot residue particles. If suspect particle is found, Energy Dispersive Spectroscopy technique is used to identify elements in that particle.
Proper citation: FEI: Phenom GSR Desktop SEM (RRID:SCR_019896) Copy
https://www.fei.com/products/efa/meridian-m-for-semiconductors/
Electrical failure analysis system for semiconductors that uses high sensitivity broadband DBX photon emission and Static Laser Stimulation techniques to pinpoint the location of electrical faults.
Proper citation: FEI: Meridian M System for Semiconductors (RRID:SCR_019897) Copy
https://www.fei.com/products/efa/elite-for-semiconductors/
Semiconductor with enhanced lock in thermal emission that provides better signal to noise ratio, increased sensitivity and higher feature resolution than steady state thermography.
Proper citation: FEI: ELITE System for Semiconductors (RRID:SCR_019891) Copy
https://www.fei.com/products/efa/meridian-ws-dp-for-semiconductors/
Electrical failure analysis system for semiconductors that enables faster defect localization by using production testers, load boards, and probe cards.
Proper citation: FEI: Meridian WS-DP System for Semiconductors (RRID:SCR_019890) Copy
Automated pipetting workstation that includes a proprietary module to mix, heat or cool samples and reagents. The module can be loaded and unloaded with the gripper and pipetting to the mixer is possible before and after mixing steps.
Proper citation: Eppendorf: epMotion 5075t Automated Pipetting (RRID:SCR_019868) Copy
https://www.fei.com/products/sem/quattro-for-materials-science/
Scanning electron microscope that combines a field emission gun (FEG) and three vacuum modes (high vacuum, low vacuum, and ESEM) to provide the flexibility to accommodate a wide range of samples, including those that are outgassing or otherwise not vacuum-compatible.
Proper citation: FEI: Quattro ESEM (RRID:SCR_019901) Copy
Automated pipetting workstation that allows walk away automation of purification protocols that rely on vacuum filtration performing applications, such as nucleic acid purification or solid phase extraction away from workbench.
Proper citation: Eppendorf: epMotion 5075v Automated Pipetting (RRID:SCR_019869) Copy
Centrifuge for medium capacity needs that allows for molecular applications in tubes up to 250 mL and offers additional swing bucket and fixed angle rotors as well as deepwell plate capacity for versatility. It has a centrifugation speed of up to14,000 rpm.
Proper citation: Eppendorf: 5804R Centrifuge (RRID:SCR_019860) Copy
https://www.fei.com/products/tem/talos-f200x-for-materials-science/
Transmission electron microscope that combines high-resolution STEM and TEM imaging with energy dispersive X-ray spectroscopy signal detection.
Proper citation: FEI: Talos F200X G2 TEM and STEM (RRID:SCR_019907) Copy
https://www.fei.com/products/tem/themis-s-for-semiconductors/
Scanning/transmission electron microscope that is designed for high-speed imaging and analysis of semiconductor devices.
Proper citation: FEI: Themis S S/TEM for Semiconductors (RRID:SCR_019909) Copy
https://www.fei.com/products/tem/talos-for-life-sciences/
Microscope that is designed for performance and productivity across a wide range of samples and applications, such as 2D and 3D imaging of cells, organelles, asbestos, polymers, and soft materials, both at ambient and cryogenic temperatures.
Proper citation: FEI: Talos F200C TEM and STEM (Scanning/Transmission Electron Microscope) (RRID:SCR_019903) Copy
https://www.fei.com/products/sem/prisma-esem-for-materials-science/
Scanning electron microscope that is used for industrial research and development with environmental SEM capability.
Proper citation: FEI: Prisma E SEM (RRID:SCR_019904) Copy
https://www.fei.com/products/tem/talos-arctica-for-life-sciences/
Transmission electron microscope that is built for delivering high-resolution 3D characterization of biological samples and biomaterials in cell biology, structural biology, and nanotechnology research.
Proper citation: FEI: Talos Arctica Cryo-TEM (RRID:SCR_019905) Copy
https://www.fei.com/products/tem/talos-f200s-for-materials-science/
TEM and STEM microscope for dynamic microscopy.
Proper citation: FEI: Talos F200S G2 TEM and STEM (RRID:SCR_019906) Copy
http://ohsu.eagle-i.net/i/0000012f-bd42-ce30-a63c-45b480000000
Biological shaker with heavy-duty drives that provide long life and quiet operation under moderate loads and at speeds up to 400 rpm.
Proper citation: Excella: NB24 Shaking Incubator (RRID:SCR_019877) Copy
https://www.fei.com/products/tem/themis-z-for-materials-science/
Next generation, ultra-high resolution, aberration corrected, scanning transmission electron microscope delivering the ultimate optical performance and flexibility with unprecedented reproducibility.
Proper citation: FEI: Themis Z for Materials Science (RRID:SCR_019910) Copy
https://www.fei.com/products/sem/apreo-sem-for-life-sciences/
Scanning electron microscope that provides a sub-nanometer or all-around nanometer resolution performance on materials spanning from catalysts, powders, nanoparticles, and bulk magnetic samples to nanodevices.
Proper citation: FEI: Apreo SEM (Scanning Electron Microscope) for Life Sciences (RRID:SCR_019879) Copy
https://www.fei.com/products/fib/v400ace-focused-ion-beam-for-semiconductors/
Focused ion beam system that can be configured for backside editing with an optional IR microscope and bulk silicon trenching package.
Proper citation: FEI: V400ACE Focused Ion Beam for Semiconductors (RRID:SCR_019912) Copy
Automated pipetting workstation that automates multichannel pipetting, with reproducibility of results from cell based assays, ELISA, cell seeding, nucleic acid quantification, plate reformatting, or other applications.
Proper citation: Eppendorf: epMotion 96 and 96xl Automated Pipetting (RRID:SCR_019873) Copy
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