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https://www.labtech.com.mx/files/LX60-cabinet.pdf
LX-60 Specimen Radiography System is best for imaging larger animals and more dense specimens, due to its cabinet size and energy range of up to 60 kV. The system's large 12 cm x 12 cm camera offers 10 lp/mm spatial resolution. Magnification allows for spatial resolution of up to 60 lp/mm. The 10-12 �m typical focal spot and up to 6X additional geometric magnification provide ultra high-contrast and high spatial resolution images. If a larger field of view is required, the LX-60 can be used with a CR plate and small, upright CR reader to obtain a field of view up to 10� x 12� (25.4 cm x 30.5 cm).
Proper citation: Faxitron: LX-60 X-Ray Machine (RRID:SCR_019884) Copy
https://www.fei.com/products/efa/hyperion-II-for-semiconductors/
Electrical failure analysis system for semiconductors that offers transistor probing for electrical characterization and fault localization in support of semiconductor technology development, yield engineering and device reliability improvement.
Proper citation: FEI: Hyperion II System (RRID:SCR_019885) Copy
https://raw.githubusercontent.com/SciCrunch/RRID-Instruments/refs/heads/main/PDF/SCR_019886.pdf
Wafer analysis system that can create site-specific transmission electron microscope (TEM) samples thin enough to capture a single transistor at the 10nm node, from wafers up to 300mm in diameter.
Proper citation: FEI: Helios NanoLab 1200AT DualBeam for Semiconductors (RRID:SCR_019886) Copy
https://www.fei.com/products/tem/krios-g3i-cryo-tem-for-life-sciences/
Transmission electron microscope that is used for automated applications such as single particle analysis, cryo-electron tomography, and micro electron diffraction.
Proper citation: FEI: Krios G4 Cryo-TEM (RRID:SCR_019887) Copy
Liquid handler specifically designed for Protein Crystallography that uses patented microfluidic technology to dispense up to 34 different ingredients. A 96-nozzle dispensing chip can dispense any volume of any ingredient of any viscosity into any well.
Proper citation: Formulatrix: Formulator liquid handler for preparing crystallization reservoirs (RRID:SCR_019920) Copy
Sample preparation tool used for the preparation of thin, electron transparent lamellas for high resolution cryo electron tomography or MicroED of micro crystals.
Proper citation: Thermo Fisher: FEI Aquilos 2 Cryo-FIB for Life Sciences (RRID:SCR_019880) Copy
https://www.fei.com/products/efa/flexprober-for-semiconductors/
Nanoprobing platform that provides electrical characterization and fault isolation capabilities for process development, device design debug, and failure analysis.
Proper citation: FEI: flexProber System for Semiconductors (RRID:SCR_019881) Copy
https://www.fei.com/products/sem/phenom-pure/
Desktop scanning electron microscope that provides high-quality images and features autofocus and automated source alignments.
Proper citation: FEI: Phenom Pure Desktop SEM (RRID:SCR_019899) Copy
https://www.fei.com/products/fib/optifib-taipan-for-semiconductors/
Focused ion beam system that for semiconductors that enables a highly controlled beam profile and current, accurate navigation and ion beam placement, and reliable end-pointing.
Proper citation: FEI: OptiFIB Taipan for Semiconductors (RRID:SCR_019895) Copy
https://www.fei.com/products/sem/phenom-gsr/
Desktop scanning electron microscope that is used to scan sample and find suspect gunshot residue particles. If suspect particle is found, Energy Dispersive Spectroscopy technique is used to identify elements in that particle.
Proper citation: FEI: Phenom GSR Desktop SEM (RRID:SCR_019896) Copy
https://www.fei.com/products/efa/meridian-m-for-semiconductors/
Electrical failure analysis system for semiconductors that uses high sensitivity broadband DBX photon emission and Static Laser Stimulation techniques to pinpoint the location of electrical faults.
Proper citation: FEI: Meridian M System for Semiconductors (RRID:SCR_019897) Copy
https://www.fei.com/products/efa/elite-for-semiconductors/
Semiconductor with enhanced lock in thermal emission that provides better signal to noise ratio, increased sensitivity and higher feature resolution than steady state thermography.
Proper citation: FEI: ELITE System for Semiconductors (RRID:SCR_019891) Copy
https://www.fei.com/products/efa/meridian-ws-dp-for-semiconductors/
Electrical failure analysis system for semiconductors that enables faster defect localization by using production testers, load boards, and probe cards.
Proper citation: FEI: Meridian WS-DP System for Semiconductors (RRID:SCR_019890) Copy
Automated pipetting workstation that includes a proprietary module to mix, heat or cool samples and reagents. The module can be loaded and unloaded with the gripper and pipetting to the mixer is possible before and after mixing steps.
Proper citation: Eppendorf: epMotion 5075t Automated Pipetting (RRID:SCR_019868) Copy
https://www.fei.com/products/sem/quattro-for-materials-science/
Scanning electron microscope that combines a field emission gun (FEG) and three vacuum modes (high vacuum, low vacuum, and ESEM) to provide the flexibility to accommodate a wide range of samples, including those that are outgassing or otherwise not vacuum-compatible.
Proper citation: FEI: Quattro ESEM (RRID:SCR_019901) Copy
Automated pipetting workstation that allows walk away automation of purification protocols that rely on vacuum filtration performing applications, such as nucleic acid purification or solid phase extraction away from workbench.
Proper citation: Eppendorf: epMotion 5075v Automated Pipetting (RRID:SCR_019869) Copy
Centrifuge for medium capacity needs that allows for molecular applications in tubes up to 250 mL and offers additional swing bucket and fixed angle rotors as well as deepwell plate capacity for versatility. It has a centrifugation speed of up to14,000 rpm.
Proper citation: Eppendorf: 5804R Centrifuge (RRID:SCR_019860) Copy
https://www.fei.com/products/tem/talos-f200x-for-materials-science/
Transmission electron microscope that combines high-resolution STEM and TEM imaging with energy dispersive X-ray spectroscopy signal detection.
Proper citation: FEI: Talos F200X G2 TEM and STEM (RRID:SCR_019907) Copy
https://www.fei.com/products/tem/themis-s-for-semiconductors/
Scanning/transmission electron microscope that is designed for high-speed imaging and analysis of semiconductor devices.
Proper citation: FEI: Themis S S/TEM for Semiconductors (RRID:SCR_019909) Copy
https://www.fei.com/products/tem/talos-for-life-sciences/
Microscope that is designed for performance and productivity across a wide range of samples and applications, such as 2D and 3D imaging of cells, organelles, asbestos, polymers, and soft materials, both at ambient and cryogenic temperatures.
Proper citation: FEI: Talos F200C TEM and STEM (Scanning/Transmission Electron Microscope) (RRID:SCR_019903) Copy
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