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URL: https://www.jeol.com/products/scientific/sem/JCM-6000.php
Proper Citation: JEOL: JCM-6000 Benchtop Scanning Electron Microscope (RRID:SCR_027403)
Description: Compact Benchtop Scanning Electron Microscope. Intuitive operation is achieved via touch panel and new operation screens. The high or low vacuum mode is included in the standard configuration, and EDS can be installed, offering truly multi-functional benchtop SEM.
Synonyms: Jeol JCM-6000
Resource Type: instrument resource
Keywords: Jeol, benchtop, scanning electron microscope, microscope
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