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URL: https://www.fei.com/products/sem/Verios-G4-XHR-SEM-for-Materials-Science/
Proper Citation: FEI: Verios 5 XHR SEM (RRID:SCR_019914)
Description: Microscope that is used for characterization of nanomaterials with sub nanometer resolution and high material contrast SEM.
Resource Type: instrument resource
Keywords: FEI, SEM, Instrument Equipment, USEDit,
Availability: Commercially available
Resource Name: FEI: Verios 5 XHR SEM
Resource ID: SCR_019914
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Source: SciCrunch Registry (RRID:SCR_005400)
Description: Interactive portal for finding and submitting biomedical resources. Resources within SciCrunch have assigned RRIDs which are used to cite resources in scientific manuscripts. SciCrunch Registry, formerly NIF Registry, provides resources catalog. Allows to add new resources. Allows edit existing resources after registration. Curators are tasked with identifying and registering resources, examining data, writing configuration files to index and display data and keeping contents current.
URL: https://rrid.site/rin/sources/SCR_005400