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URL: https://www.fei.com/products/fib/v400ace-focused-ion-beam-for-semiconductors/
Proper Citation: FEI: V400ACE Focused Ion Beam for Semiconductors (RRID:SCR_019912)
Description: Focused ion beam system that can be configured for backside editing with an optional IR microscope and bulk silicon trenching package.
Resource Type: instrument resource
Keywords: FEI, FIB Microscope, Instrument Equipment, USEDit,
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