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Resource Name
FEI: V400ACE Focused Ion Beam for Semiconductors
RRID:SCR_019912 RRID Copied      
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FEI: V400ACE Focused Ion Beam for Semiconductors (RRID:SCR_019912)
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Resource Information

URL: https://www.fei.com/products/fib/v400ace-focused-ion-beam-for-semiconductors/

Proper Citation: FEI: V400ACE Focused Ion Beam for Semiconductors (RRID:SCR_019912)

Description: Focused ion beam system that can be configured for backside editing with an optional IR microscope and bulk silicon trenching package.

Resource Type: instrument resource

Keywords: FEI, FIB Microscope, Instrument Equipment, USEDit,

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