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URL: https://www.fei.com/products/tem/themis-z-for-materials-science/
Proper Citation: FEI: Themis Z for Materials Science (RRID:SCR_019910)
Description: Next generation, ultra-high resolution, aberration corrected, scanning transmission electron microscope delivering the ultimate optical performance and flexibility with unprecedented reproducibility.
Resource Type: instrument resource
Keywords: FEI, TEM, Instrument Equipment, USEDit,
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