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URL: https://www.fei.com/products/sem/quattro-for-materials-science/
Proper Citation: FEI: Quattro ESEM (RRID:SCR_019901)
Description: Scanning electron microscope that combines a field emission gun (FEG) and three vacuum modes (high vacuum, low vacuum, and ESEM) to provide the flexibility to accommodate a wide range of samples, including those that are outgassing or otherwise not vacuum-compatible.
Resource Type: instrument resource
Keywords: FEI, SEM, Instrument Equipment, USEDit, Environmental Scanning Electron Microscope, electron microscope,
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