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URL: https://www.fei.com/products/fib/optifib-taipan-for-semiconductors/
Proper Citation: FEI: OptiFIB Taipan for Semiconductors (RRID:SCR_019895)
Description: Focused ion beam system that for semiconductors that enables a highly controlled beam profile and current, accurate navigation and ion beam placement, and reliable end-pointing.
Resource Type: instrument resource
Keywords: FEI, FIB Microscope, Instrument Equipment, USEDit,
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