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URL: https://www.fei.com/products/efa/meridian-ws-dp-for-semiconductors/
Proper Citation: FEI: Meridian WS-DP System for Semiconductors (RRID:SCR_019890)
Description: Electrical failure analysis system for semiconductors that enables faster defect localization by using production testers, load boards, and probe cards.
Resource Type: instrument resource
Keywords: FEI, EFA System, Instrument Equipment, USEDit,
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