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URL: https://www.fei.com/products/efa/flexprober-for-semiconductors/
Proper Citation: FEI: flexProber System for Semiconductors (RRID:SCR_019881)
Description: Nanoprobing platform that provides electrical characterization and fault isolation capabilities for process development, device design debug, and failure analysis.
Resource Type: instrument resource
Keywords: FEI, EFA System, Instrument Equipment, USEDit,
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