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URL: https://www.laboratorynetwork.com/doc/leo-1525-field-emission-scanning-electron-mic-0001
Proper Citation: Zeiss LEO 1525 Field Emission Scanning Electron Microscope (RRID:SCR_018039)
Description: Field emission scanning electron microscope that performs ultra high resolution imaging and analysis. Designed for requirements of nano-analysis, chamber of LEO 1525 is capable of accommodating both EDS and full-focusing Wavelength-dispersive X-ray spectroscopy WDS spectrometers as well as rage of other accessories. Coincident and short working distances allow signals from these detectors to be acquired simultaneously.
Synonyms: LEO 1525
Resource Type: instrument resource
Keywords: ABRF, Field Emission Scanning Electron Microscope, instrument, equipment
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