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URL: https://www.yxlon.com/en/products/x-ray-and-ct-inspection-systems/yxlon-ff70-cl
Proper Citation: YXLON: FF70 CL X-Ray System (RRID:SCR_020908)
Description: X ray inspection system has been developed to enable automated analysis for flaws in semi-conductors. Flaws can be found on wafer, on substrate, in strip in sub assembly or in final device.
Resource Type: instrument resource
Keywords: YXLON, X-Ray System, Instrument Equipment, USEDit,
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