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URL: https://www.utoledo.edu/engineering/cmsc/instruments/afm.html
Proper Citation: Roche: Veeco Nanoscope IIIA Atomic Force Microscope (RRID:SCR_020873)
Description: Veeco Multimode Nanoscope IIIa AFM has a resolution of ~ 0.3 nm with A scanner. The instrument is capable of imaging areas ~ 1 sq.,m (using the standard A scanner), ~12 sq.,m. (using vertical engagement EV scanner) and ~125 sq.,m (using vertical engagement JV scanner) in the XY direction. The scanning range in the Z direction for EV and JV scanner are ~ 2,m and ~ 5,m respectively. The AFM is capable of imaging in Contact mode and Tapping mode with Nanoindentation capabilities. Attachments include a Fluid Cell for imaging in liquids (Contact and Tapping mode) and an Anti-vibration suspension mount for atomic resolution imaging. A 15 mm sample disc is used to mount the samples with access to ~ 2-3 mm area at the center of the sample.
Resource Type: instrument resource
Keywords: Veeco, Atomic Force Microscope, Instrument Equipment, USEDit
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